Scanning Low-Energy Electron Microscopy
作者： Ilona Müllerová , Ludĕk Frank
DOI: 10.1016/S1076-5670(03)80066-6
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sci-hub.se 参考文章(162)
C.J. Tung, J.C. Ashley, R.H. Ritchie, Electron inelastic mean free paths and energy losses in solids II Surface Science. ,vol. 81, pp. 427- 439 ,(1979) , 10.1016/0039-6028(79)90110-9
Luděk Frank, Advances in scanning electron microscopy Advances in Imaging and Electron Physics. ,vol. 123, pp. 327- 373 ,(2002) , 10.1016/S1076-5670(02)80069-6
H. Kulenkampff, W. Spyra, Energieverteilung rückdiffundierter Elektronen European Physical Journal. ,vol. 137, pp. 416- 425 ,(1954) , 10.1007/BF01333457
Ilona Müllerová, Michal Lenc, The Scanning Very-Low-Energy Electron Microscope (SVLEEM) Mikrochimica Acta. pp. 173- 177 ,(1992) , 10.1007/978-3-7091-6679-6_16
Wolfgang S. M. Werner, Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications Mikrochimica acta. Supplementum. ,vol. 13, pp. 13- 38 ,(1996) , 10.1007/978-3-7091-6555-3_2
Ernst Bauer, Wolfgang Telieps, Emission and Low Energy Reflection Electron Microscopy Surface and Interface Characterization by Electron Optical Methods. pp. 195- 233 ,(1988) , 10.1007/978-1-4615-9537-3_12
W. Dietrich, H. Seiler, Energieverteilung von Elektronen, die durch Ionen und Elektronen in Durchstrahlung an dünnen Folien ausgelöst werden European Physical Journal. ,vol. 157, pp. 576- 585 ,(1960) , 10.1007/BF01340715
Walter Glaser, Grundlagen der Elektronenoptik Springer. ,(1952) , 10.1007/978-3-662-25699-2
Surface and Interface Characterization by Electron Optical Methods Plenum Press. ,(1989) , 10.1007/978-1-4615-9537-3
O. Hachenberg, W. Brauer, Secondary Electron Emission from Solids Advances in Electronics and Electron Physics. ,vol. 11, pp. 413- 499 ,(1959) , 10.1016/S0065-2539(08)60999-3