Modular atomic force microscope

摘要: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, forces and movements, free noise artifacts, that old generations these devices have increasingly been unable to provide. The includes a chassis, foundation on modules instrument are supported; view module providing optics for viewing sample probe; head components optical lever arrangement steering focusing those components; scanner XYZ translation stage actuates dimensions engage mechanism; isolation encloses chassis acoustic and/or thermal an electronics which, together with separate controller, provide acquiring processing images controlling other functions instrument. All many their subassemblies replaceable potentially upgradeable. This allows updating new technology as it becomes available.