A microcomputer-controlled background correction system for atomic spectrometry

作者: Thomas C. O'Haver , James M. Harnly , John Marshall , John Carroll , David Littlejohn

DOI: 10.1039/AN9851000451

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摘要: A novel instrument system has been designed for use in atomic spectrometry. An Apple microcomputer is used to control data acquisition and perform processing a single-channel spectrometer system, which may be applied continuum-source atomic-absorption or atomic-emission measurement. Wavelength modulation, rapid, repetitive scanning procedure, employed automatic background correction under computer control. The programs are written BASIC with incorporated assembly language subroutines. steady-state atomisation mode (e.g., flames) transient electrothermal atomisers) either absorption emission program provides peak-height peak-area simultaneously procedure available that allows the extension of linear calibration range. Detection limits obtained using comparable previously reported values. software organisation operating procedures described illustrated typical output signals measured by system.

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