作者: N Terada , K Tanaka , Y Tanaka , A Iyo , K Tokiwa
DOI: 10.1016/S0921-4526(99)02430-8
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摘要: Abstract A change of electronic structure (Cu,Tl)Ba2Ca2Cu3Oy with reduction annealing has been studied by X-ray photoemission spectroscopy (XPS). By in situ measurement, photoelectron Fermi level is clearly observed. The XPS signals indicates that the treatment above 400°C should cause electron movement from CuO2 planes to Tl–O, which result a re-increase hole content and improvement superconducting properties.