Spectroscopic characterization of BPSCCO thin films grown by dip-coating technique
作者： C.L. Carvalho , I. Guedes
DOI: 10.1016/S0921-4534(03)00701-9
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摘要: Abstract This work describes the growth of Bi 2− x Pb Sr 2 Ca n −1 Cu O +4 thin films by dip-coating technique for 0.4⩽ ⩽1. X-ray and Raman spectroscopic techniques were carried out in order to characterize at room temperature. From data it is observed that are multi-phased presenting phases 2201, 2212 2223 along with undesirable PbO 4 phase. It also phase becomes dominant when content increases. The modes agree overall features expected these compounds.
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