Measuring graphene adhesion using atomic force microscopy with a microsphere tip

作者: Tao Jiang , Yong Zhu

DOI: 10.1039/C5NR02480C

关键词:

摘要: Van der Waals adhesion between graphene and various substrates has an important impact on the physical properties, device applications nanomanufacturing processes of graphene. Here we report a general, high-throughput reliable method that can measure energies ultraflat broad range materials using atomic force microscopy with microsphere tip. In our experiments, only van tip flake is measured. The Maugis–Dugdale theory employed to convert measured AFM energy. ultraflatness monolayer mica eliminates effect surface roughness adhesion, while addressed by modified Rumpf model. Adhesion SiO2 Cu are obtained as 0.46 0.75 J m−2, respectively. This work provides valuable insight into mechanism readily extend measurement for other 2D nanomaterials.

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