Explaining cache SER anomaly using DUE AVF measurement

摘要: We have discovered that processors can experience a super-linear increase in detected unrecoverable errors (DUE) when the write-back L2 cache is doubled size. This paper explains how an tag's Architectural Vulnerability Factor or AVF caused such DUE rate. expresses fraction of faults become user-visible errors. Our hypothesis this by “dirty” data residence times cache. Using proton beam irradiation, we measured rates from tags and analyzed to show our holds. utilized combination simulation measurements help develop prove hypothesis. investigation reveals two methods which dirty line residency causes increases AVF. One reduction miss as move larger part, resulting fewer evictions required for architecturally correct execution. The second occurrence strided access patterns, cause significant lines without increasing