Embossed-carving processing of cytoskeletons of cultured cells by using focused ion beam technology
作者： Dohiko Terada , Shinya Hattori , Takako Honda , Masanori Iitake , Hisatoshi Kobayashi
DOI: 10.1002/JEMT.22166
关键词:
摘要: The focused ion beam (FIB) technology has drawn considerable attention in diverse research fields. FIB can be used to mill samples at the nanometer scale by using an derived from electrically charged liquid gallium (Ga). This powerful with accuracy is now being applied life science research. In this study, we show potential of as a new tool investigate internal structures cells. We sputtered Ga(+) onto surface or cross section animal cells emboss cell. sputtering erode cell and thus cytoskeletons quasi-3 dimensionally. also identified embossed comparing them fluorescent images obtained via confocal laser microscopy because secondary micrographs did not directly provide qualitative information directly. Furthermore, considered artifacts during sectioning propose way prevent undesirable artifacts. demonstrate usefulness observe
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