Electron and ion imaging of gland cells using the FIB/SEM system.

作者: D. DROBNE , M. MILANI , A. ZRIMEC , V. LESER , M. BERDEN ZRIMEC

DOI: 10.1111/J.1365-2818.2005.01490.X

关键词:

摘要: Summary The FIB/SEM system was satisfactorily used for scanning ion (SIM) and electron microscopy (SEM) of gland epithelial cells a terrestrial isopod Po rcellio scaber (Isopoda, Crustacea). interior exposed by site-specific in situ focused beam (FIB) milling. Scanning (SI) imaging an adequate substitution (SE) when charging rendered SE impossible. No significant differences resolution between the SI images were observed. contrast on both is topographic. consequences are, among others, introduction Ga + ions / into samples destruction imaged surface. These two characteristics can be advantageously. Introduction onto specimen neutralizes charge effect subsequent imaging. In addition, destructive nature as tool gradual removal layer surface, uncovering structures lying beneath. Alternative SEM SIM combination with FIB sample sectioning made it possible to image submicrometre epithelium reproducibility, repeatability same range magnifications transmission (TEM). At present state technology, ultrastructural elements cannot directly identified comparison TEM images.

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