GePSG core for a planar lightwave circuit

作者: Fan Zhong , Jonathan G. Bornstein

DOI:

关键词:

摘要: A method of depositing a core layer for an optical waveguide structure planar lightwave circuit. GePSG circuit is fabricated such that the comprises doped silica glass, wherein dopant includes Ge and P. In from which formed, two separate doping gasses (e.g., GeH 4 PH 3 ) are added during PECVD process to make P glass (GePSG). The ratio configured maintain constant refractive index within across anneal temperature range reduce formation bubbles layer. also birefringence range. thermal can be 900 C. 1200 lower reduces polarization sensitivity arrayed grating devices.

参考文章(23)
Ashima Chakravarti, Michael J. Shapiro, Kevin A. McKinley, Matthias Ilg, Markus Kirchhoff, Son V. Nguyen, Low temperature reflow dielectric-fluorinated BPSG ,(1998)
Mahesh K. Sanganeria, Douglas T. Grider, Mehmet C. Ozturk, Stanton P. Ashburn, Jimmie J. Wortman, Selective deposition of doped silicon-germanium alloy on semiconductor substrate, and resulting structures ,(1993)
Philip S. Levin, High bandwidth optical waveguide ,(1980)
Tadahiko Hanada, Takashi Saito, Optical waveguide fabrication method ,(1998)
John C. Knights, Robert A. Barker, Chuang C. Tsai, Controlled isotropic doping of semiconductor materials ,(1987)
Eric N. Randall, Ishwar D. Aggarwal, Optical waveguide containing P2 O5 and GeO2 ,(1975)
Hiroyuki Etoh, Akitoshi Ishizaka, Seijiro Furukawa, Toshikazu Shimada, Semiconductor device with crystalline silicon-germanium-carbon alloy ,(1988)