Dynamic combined pattern-parallel and fault-parallel fault simulation on computational RAM

作者: A.L.-C. Kwong , B.F. Cockburn , D.G. Elliott

DOI: 10.1109/CCECE.1999.807238

关键词:

摘要: Computational RAM (C/spl middot/RAM) is a logic-enhanced memory architecture that supports massively-parallel bit-serial computation. Previous work (J.A. Waicukauski et al., 1987; B.F. Cockburn 1998, A.L.-C. Kwong, 1998) investigated the implementation of fault-parallel and pattern-parallel fault simulation algorithms on C/spl middot/RAM. The strategy was found to be efficient at start but inefficient end. converse behaviour observed for strategy. A dynamic hybrid algorithm combines strategies in an adjustable proportion so as obtain best aspects both. This paper describes simulator middot/RAM models detection combinational logic stuck-at faults, transition faults order 1, CMOS transistor stuck-open faults.

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