Microscope Mode Secondary Ion Mass Spectrometry Imaging with a Timepix Detector
作者： Andras Kiss , Julia H. Jungmann , Donald F. Smith , Ron M. A. Heeren
DOI: 10.1063/1.4772396
关键词:
摘要: In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with Secondary Ion Mass Spectrometer for microscope mode SIMS imaging. Time resolved images various benchmark samples demonstrate imaging capabilities system. The main advantages are higher signal-to-noise ratio acquisition arrival time position. Microscope biomolecules is demonstrated tissue sections detector.
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