Statistical corner evaluation for complex on chip variation model

摘要: The invention provides a method for performing statistical static timing analysis using novel on-chip variation model, referred to as Sensitivity-based Complex Statistical On-Chip Variation (SCS-OCV). SCS-OCV introduces complex concept resolve the blocking technical issue of combining local random variations, enabling accurate calculation variations with correlations, such common-path pessimism removal (CPPR). proposes practical min/max operations that can guarantee at nominal and targeted N-sigma corner, extends handle graph-based full arrival/required time propagation under variable compaction. corner evaluation variables transform vector-based parametric information single-value corner-based report, based on derives equations bridge POCV/SSTA LOCV. This significantly reduces learning curve increases usage technology, being more easily adopted by industry.