Thickness and dielectric constant of dead layer in Pt/(Ba0.7Sr0.3)TiO3/YBa2Cu3O7-x capacitor
作者： B. Chen , H. Yang , L. Zhao , J. Miao , B. Xu
DOI: 10.1063/1.1644342
关键词:
摘要: Pt/(Ba0.7Sr0.3)TiO3 (BST)/YBa2Cu3O7−x capacitors were prepared and investigated for the dead-layer (DL) thickness (td) DL dielectric constant (ed). Based on series capacitor model, td/ed ratio of 0.066 nm bulk BST ferroelectric-layer 1370 obtained through measurements capacitance–voltage characteristics. The td×ed value 120 was current–voltage Combining these data, are respectively estimated to be 2.8 42.6.
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L. J. Sinnamon, R. M. Bowman, J. M. Gregg, Investigation of dead-layer thickness in SrRuO3/Ba0.5Sr0.5TiO3/Au thin-film capacitors Applied Physics Letters. ,vol. 78, pp. 1724- 1726 ,(2001) , 10.1063/1.1356731
Hao Yang, Kun Tao, Bin Chen, Xianggang Qiu, Bo Xu, Bairu Zhao, Leakage mechanism of (Ba0.7Sr0.3)TiO3 thin films in the low-temperature range Applied Physics Letters. ,vol. 81, pp. 4817- 4819 ,(2002) , 10.1063/1.1529087
Y. L. Qin, C. L. Jia, K. Urban, R. Liedtke, R. Waser, Structural and morphologic evolution of Pt/Ba0.7Sr0.3TiO3/Pt capacitors with annealing processes Applied Physics Letters. ,vol. 80, pp. 2728- 2730 ,(2002) , 10.1063/1.1469683
H.Z. Jin, J. Zhu, P. Ehrhart, F. Fitsilis, C.L. Jia, S. Regnery, K. Urban, R. Waser, An interfacial defect layer observed at (Ba, Sr)TiO3/Pt interface Thin Solid Films. ,vol. 429, pp. 282- 285 ,(2003) , 10.1016/S0040-6090(02)01330-5
Byoung Taek Lee, Cheol Seong Hwang, Influences of interfacial intrinsic low-dielectric layers on the dielectric properties of sputtered (Ba,Sr)TiO3 thin films Applied Physics Letters. ,vol. 77, pp. 124- 126 ,(2000) , 10.1063/1.126897
F. Fitsilis, S. Regnery, P. Ehrhart, R. Waser, F. Schienle, M. Schumacher, H. Juergensen, Structure property relations of BST thin films Integrated Ferroelectrics. ,vol. 38, pp. 211- 220 ,(2001) , 10.1080/10584580108016934
Cheol Seong Hwang, Byoung Taek Lee, Chang Seok Kang, Ki Hoon Lee, Hag-Ju Cho, Horii Hideki, Wan Don Kim, Sang In Lee, Moon Yong Lee, Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and (Ba, Sr)TiO3 thin films Journal of Applied Physics. ,vol. 85, pp. 287- 295 ,(1999) , 10.1063/1.369443
Kazuhide Abe, Shuichi Komatsu, Measurement and Thermodynamic Analyses of the Dielectric Constant of Epitaxially Grown SrTiO3Films Japanese Journal of Applied Physics. ,vol. 32, pp. L1157- L1159 ,(1993) , 10.1143/JJAP.32.L1157
A. M. Bratkovsky, A. P. Levanyuk, Abrupt Appearance of the Domain Pattern and Fatigue of Thin Ferroelectric Films Physical Review Letters. ,vol. 84, pp. 3177- 3180 ,(2000) , 10.1103/PHYSREVLETT.84.3177
C. Zhou, D. M. Newns, Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors Journal of Applied Physics. ,vol. 82, pp. 3081- 3088 ,(1997) , 10.1063/1.366147