Transition behavior of PS-b-PMMA films on the balanced interfacial interactions

摘要: Abstract The thickness dependence of the order-to-disorder transition (ODT), measured by in situ grazing-incidence small-angle X-ray scattering (GISAXS), has been investigated thin films a symmetric polystyrene- b -poly(methyl methacrylate) (PS- -PMMA) on random copolymer (P(S- r -MMA)) grafted to substrate where interfacial interactions are balanced. With decreasing film less than 25 L 0 , ODT significantly decreases 193 °C for 10 thickness, because provide surface-induced compatibilization toward two block components. However, plateau at ∼213 °C thicker was observed above bulk value 200 °C. elevation this indicates suppression compositional fluctuations normal surface, more likely dominant orientation lamellar microdomains found be parallel surface.