Symbolic Parasitic Extractor for Circuit Simulation (SPECS)

作者: M. Ellement , C. E. Huang , P. J. Fowler , J. D. Bastian , L. P. McNamee

DOI: 10.5555/800032.800687

关键词:

摘要: This paper describes the design, development and implementation of program SPECS. The purpose SPECS is to automatically extract from a Rockwell microelectronic symbolic matrix description netlist for circuit simulation. differs others in that it uses symbol layout as an input, calculates both interelectrode intrinsic capacitance, conductor resistance, produces schematic representation network has selective TRACE, i.e., traces only or interest.

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