Extended fine structure in characteristic X-ray fluorescence: A novel structural analysis method of condensed systems
作者： Kouichi Hayashi , Jun Kawai , Yasuhiro Awakura
DOI: 10.1016/S0584-8547(97)00097-9
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摘要: An oscillation similar to that in extended X-ray absorption fine structure (EXAFS) is found characteristic fluorescence spectra, originating from a quantum interference effect during the emission process solid. We observe oscillating radiative Auger spectra of aluminum metal. The Al-Al interatomic distances are successfully reproduced by Fourier transform structure. Thus, present method has potential become convenient alternative EXAFS measurement for light elements.
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