作者: Takashi Fujikawa , Jun Kawai
DOI: 10.1143/JPSJ.68.4032
关键词:
摘要: A simple theoretical approach is given to study XAFS-like spectra (extended X-ray emission fine structure, EXEFS) observed in fluorescence based on one-step quantum mechanical formula derived by Almbladh and Hedin. Electronic relaxation shake-off processes are crucial explain the spectral features. Here “shake-off” different from those found typical XPS XAFS spectra; electrons ejected during processes. Formal EXEFS formulas here same as usually used formula. However, we should carefully use phase shifts taking account of effects due additional core hole production; they be analyses. The radial dipole integral replaced corresponding monopole