Si X-ray absorption near edge structure (XANES) of Si, SiC, SiO2, and Si3N4 measured by an electron probe X-ray microanalyzer (EPMA)
作者： Jun Kawai , Hideyuki Takahashi
DOI: 10.1016/S0584-8547(98)00153-0
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摘要: … Consequently, though we have claimed in the present report that the XANES spectra are measurable using EPMA, this claims a rough similarity between the RAE and XANES, but the …
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