作者: Eric A. Hudson , James V. Tietz
DOI:
关键词:
摘要: A method for etching a layer over substrate is provided. gas-modulated cyclic process performed more than three cycles. Each cycle comprises performing protective forming phase using first gas chemistry with deposition chemistry, which in about 0.0055 to 7 seconds each and an the feature through etch mask second reactive 0.005 14 cycle. The providing plasma from gas.