Topographic Characterization of Cu–Ni NPs @ a-C:H Films by AFM and Multifractal Analysis
作者： Ştefan Ţălu , Sebastian Stach , Tayebeh Ghodselahi , Atefeh Ghaderi , Shahram Solaymani
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摘要: … In the present work Cu–Ni NPs @ aC:H with constant thickness of Cu and three thicknesses of Ni were prepared by RF-PECVD system. The RBS spectra also were obtained to …
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