Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates
作者： Ştefan Ţălu , Sebastian Stach , Aman Mahajan , Dinesh Pathak , Tomas Wagner
DOI: 10.1002/SIA.5492
关键词: Nanometre 、 Nanotechnology 、 Multifractal system 、 Surface roughness 、 Surface finish 、 Indium tin oxide 、 Materials science 、 Composite material 、 Drop (liquid) 、 Copper 、 Organic semiconductor
摘要: This paper applies multifractal spectrum theory to characterize the structural complexity of 3D surface roughness copper (II) tetrasulfophthalocyanine (CuTsPc) films on indium tin oxide (ITO) substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc were prepared by drop cast method ITO substrate. was studied AFM in tapping-mode™, air, square areas 2500 µm2. A novel approach, basis computational algorithms for analysis applied data, presented. Results revealed that substrate can be described using geometry. The generalized dimensions Dq and f(α) provided quantitative values local scale properties geometry at nanometer scale. Data provide valuable information describe spatial arrangement which not taken into account classical statistical parameters. Copyright © 2014 John Wiley & Sons, Ltd.
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