Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation
作者： Ştefan Ţălu , Zoran Marković , Sebastian Stach , B. Todorović Marković , Mihai Ţălu
DOI: 10.1016/J.APSUSC.2013.10.114
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摘要: Abstract This study presents a multifractal approach, obtained with atomic force microscopy analysis, to characterize the structural evolution of single wall carbon nanotube thin films upon exposure optical parametric oscillator laser irradiation at wavelength 430 nm. Microstructure and morphological changes deposited on different substrates (mica TGX grating) were recorded by microscope. A detailed methodology for surface characterization, which may be applied data, was presented. Multifractal analysis roughness revealed that has geometry various magnifications. The generalized dimension D q singularity spectrum f ( α ) provided quantitative values local scale properties morphology nanometer scale. provides yet complementary information offered traditional statistical parameters.
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