Uniformity analysis in nanocrystalline silver thin films using fuzzy inference system
作者： Jisha John , Madhu S. Nair , K. G. Gopchandran , M. Wilscy
DOI: 10.1002/SIA.5628
关键词: Nanostructure 、 Feature (computer vision) 、 Thin film 、 Wavelet 、 Texture (crystalline) 、 Nanotechnology 、 Optoelectronics 、 Deposition (phase transition) 、 Pulsed laser deposition 、 Nanocrystalline material 、 Materials science
摘要: An automatic and efficient technique to analyze the uniformity of nanoscale images using wavelets, feature similarity index measure (FSIM) fuzzy inference system is reported. It has been successfully tested on scanning electron micrographs nanocrystalline silver thin films. Thin films are prepared on-axis off-axis pulse laser deposition (PLD) technique. found that film PLD more uniformly distributed smoother texture compared with In order quantitatively, they transformed wavelet domain extract localized frequency variations a derived for quantitatively analyzing each image. The surface plot FSIM values image be an tool nanoscientists evaluate smoothness surfaces. This study expected help understand these nanostructures in detail. Copyright © 2014 John Wiley & Sons, Ltd.
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