Mean free paths for inelastic electron scattering in silicon and poly(styrene) nanospheres.
作者： T.M Chou , M Libera
DOI: 10.1016/S0304-3991(02)00192-4
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摘要: Abstract The mean free paths for inelastic electron scattering, λin, in silicon [Si] and poly(styrene) [PS] have been measured using off-axis holography a field-emission transmission microscope (FEG TEM). holographic imaging method determines both quantitative wave phase information as well elastic energy-filtered amplitude information. Using the data, two-dimensional t/λin images are reconstructed. present work uses spherical nanoparticles samples, so sample thickness at any point image can be calculated knowing center radius of projected nanosphere. contribution to is removed obtain λin values. This finds values λiSi=53.8±5.5 88.6±6.9 nm, λiPS=78.1±3.4 113.0±5.9 nm 120 200 keV incident energies, respectively.
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