作者: T.E. Novelo , P. Amézaga-Madrid , R.D. Maldonado , A.I. Oliva , G.M. Alonzo-Medina
DOI: 10.1016/J.MATCHAR.2015.01.010
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摘要: Abstract Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all 150 nm. alloys prepared diffusion into a vacuum oven argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed phases AuCu CuSi in the samples after annealing process. mainly obtained for 25:75 at.% samples, meanwhile AuCuII phase dominates 50:50 at.%. Additionally, 75:25 at.%, produce Au2Cu3 Au3Cu phases. formed characterized scanning electron microscopy (SEM), atomic force (AFM), transmission (TEM) energy dispersive spectroscopy (EDS) to study morphology elemental concentration alloys.