作者: G. Brill , Y. Chen , N. K. Dhar , R. Singh
DOI: 10.1007/S11664-003-0058-6
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摘要: Tellurium-adsorption studies were conducted on {111}-type Si surfaces that are off-cut from the {111} in range of 0–30° both nonpassivated-and arsenic-passivated surfaces. Relative surface coverages as a function Te exposure time and Si-surface orientation obtained with in-situ x-ray photoelectron spectroscopy (XPS). The XPS results indicate coverage increases step density increases. In contrast, Te-adsorption nonpassivated-Si showed no dependence between surface-step density. Subsequent ZnTe CdTe molecular-beam epitaxial growth these high-Miller-index further validate step-edge nucleation model. Additionally, it was observed CdTe-epilayer did not always reproduce Si-substrate initial conditions used.