作者: E. van Genderen , M. T. B. Clabbers , P. P. Das , A. Stewart , I. Nederlof
DOI: 10.1107/S2053273315022500
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摘要: Until recently, structure determination by transmission electron microscopy of beam-sensitive three-dimensional nanocrystals required diffraction tomography data collection at liquid-nitrogen temperature, in order to reduce radiation damage. Here it is shown that the novel Timepix detector combines a high dynamic range with very signal-to-noise ratio and single-electron sensitivity, enabling ab initio phasing organic compounds. Low-dose (∼0.013 e− A−2 s−1) were collected room temperature rotation method. It was ascertained sufficient quality for solution using direct methods software developed X-ray crystallography (XDS, SHELX) (ADT3D/PETS, SIR2014).