Design and analysis of compact ultra energy-efficient logic gates using laterally-actuated double-electrode NEMS

作者: Hamed F. Dadgour , Muhammad M. Hussain , Casey Smith , Kaustav Banerjee

DOI: 10.1145/1837274.1837498

关键词:

摘要: Nano-Electro-Mechanical Switches (NEMS) are among the most promising emerging devices due to their near-zero subthreshold-leakage currents. This paper reports device fabrication and modeling, as well novel logic gate design using “laterally-actuated double-electrode NEMS” structures. The new structure has several advantages over existing NEMS architectures such being immune impact bouncing release vibrations (unlike a vertically-actuated NEMS) offer higher flexibility implement compact gates single-electrode NEMS). A comprehensive analytical framework is developed model different properties of these by solving Euler-Bernoulli's beam equation. proposed validated measurement data for fabricated devices. It shown that ignoring non-uniformity electrostatic force distribution, models “underestimate” actual value V pull-in pull-out . Furthermore, energy efficient NEMS-based circuit topologies introduced inverter, NAND, NOR XOR gates. For instance, can be implemented only two compared static CMOS-based requires at least 10 transistors.

参考文章(27)
Harrie A.C. Tilmans, Rob Legtenberg, Electrostatically driven vacuum-encapsulated polysilicon resonators part II. theory and performance Sensors and Actuators A-physical. ,vol. 45, pp. 67- 84 ,(1994) , 10.1016/0924-4247(94)00813-2
N. Abele, K. Segueni, K. Boucart, F. Casset, B. Legrand, L. Buchaillot, P. Ancey, A.M. Ionescu, Ultra-Low Voltage MEMS Resonator Based on RSG-MOSFET international conference on micro electro mechanical systems. pp. 882- 885 ,(2006) , 10.1109/MEMSYS.2006.1627941
Peter Maynard Osterberg, Electrostatically actuated microelectromechanical test structures for material property measurement Massachusetts Institute of Technology. ,(1995)
Introduction to Nanoscale Science and Technology Introduction to Nanoscale Science and Technology. ,(2004) , 10.1007/B119185
Tak H. Ning, Yuan Taur, Fundamentals of Modern VLSI Devices ,(2004)
Weon Wi Jang, Jeong Oen Lee, Jun-Bo Yoon, Min-Sang Kim, Ji-Myoung Lee, Sung-Min Kim, Keun-Hwi Cho, Dong-Won Kim, Donggun Park, Won-Seong Lee, None, Fabrication and characterization of a nanoelectromechanical switch with 15-nm-thick suspension air gap Applied Physics Letters. ,vol. 92, pp. 103110- ,(2008) , 10.1063/1.2892659
David A Czaplewski, Gary A Patrizi, Garth M Kraus, Joel R Wendt, Christopher D Nordquist, Steven L Wolfley, Michael S Baker, Maarten P de Boer, A nanomechanical switch for integration with CMOS logic Journal of Micromechanics and Microengineering. ,vol. 19, pp. 085003- ,(2009) , 10.1088/0960-1317/19/8/085003
Roya Maboudian, Roger T Howe, Critical Review: Adhesion in surface micromechanical structures Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 15, pp. 1- 20 ,(1997) , 10.1116/1.589247
K. Akarvardar, D. Elata, R. Parsa, G. C. Wan, K. Yoo, J Provine, P. Peumans, R. T. Howe, H.-S. P. Wong, Design Considerations for Complementary Nanoelectromechanical Logic Gates international electron devices meeting. pp. 299- 302 ,(2007) , 10.1109/IEDM.2007.4418930
C O Mahony, M Hill, R Duane, A Mathewson, Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams Journal of Micromechanics and Microengineering. ,vol. 13, ,(2003) , 10.1088/0960-1317/13/4/312