Dynamic switching and short circuit capability of 6.5kV silicon carbide MOSFETs

作者: L. Knoll , A. Mihaila , L. Kranz , M. Bellini , S. Wirths

DOI: 10.1109/ISPSD.2018.8393700

关键词:

摘要: Electrically robust 6.5kV SiC MOSFETs are investigated for the static and dynamic performance, short circuit capability safe operation area (SOA). rated at were fabricated with different cell pitches from 12μm to 26μm that able withstand pulses of up 8μs have a turn-off SOA 4400V twice nominal current Inom. The paralleling four was tested represent realistic setup while showing substantial reduction in switching loss by more than 80% compared silicon IGBT Diode.

参考文章(4)
L. Knoll, A. Mihaila, F. Bauer, V. Sundaramoorthy, E. Bianda, R. Minamisawa, L. Kranz, M. Bellini, U. Vemulapati, H. Bartolf, S. Kicin, S. Skibin, C. Papadopoulos, M. Rahimo, Robust 3.3kV silicon carbide MOSFETs with surge and short circuit capability international symposium on power semiconductor devices and ic's. pp. 243- 246 ,(2017) , 10.23919/ISPSD.2017.7988905
Toshiaki Iwamatsu, Shuhei Nakata, Shingo Tomohisa, Satoshi Yamakawa, Koutarou Kawahara, Shiro Hino, Koji Sadamatsu, Yukiyasu Nakao, Yusuke Yamashiro, Yasuki Yamamoto, 6.5 kV schottky-barrier-diode-embedded SiC-MOSFET for compact full-unipolar module 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD). pp. 41- 44 ,(2017) , 10.23919/ISPSD.2017.7988888
Masatoshi Aketa, Takui Sakaguchi, Munaf Rahimo, Masaharu Nakanishi, Takashi Nakamura, Characterization of 3.3 kV and 6.5 kV SiC MOSFETs PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management. pp. 1- 5 ,(2017)