Power semiconductor device with floating field ring termination

Marco BELLINI Friedhelm Bauer , Umamaheswara VEMULAPATI

2019
Method for manufacturing a power semiconductor device

an VobeckyKarlheinz STIEGLERJagoda DobrzynskaMarco Bellini

2017
Phase control thyristor

Jan Vobecky Marco Bellin

2016
Power semiconductor component and method for producing such a power semiconductor component

Munaf Rahimo Marco BELLINI Friedhelm Bauer Maxi Andenna Julian Nistor

2014
Thyristor with improved plasma spreading

Jan Vobecky , Marco Bellini , Paul Commin

2016
An Active Deep Learning Method for the Detection of Defects in Power Semiconductors

Lars Knoll , Marco Bellini , Georges Pantalos , Luca De-Michielis
advanced semiconductor manufacturing conference

2021
Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits

Laleh Najafizadeh , Stanley D. Phillips , Kurt A. Moen , Ryan M. Diestelhorst
IEEE Transactions on Nuclear Science 56 ( 6) 3469 -3476

23
2009
Proton Tolerance of SiGe Precision Voltage References for Extreme Temperature Range Electronics

Laleh Najafizadeh , Marco Bellini , AP Gnana Prakash , Gustavo A Espinel
IEEE Transactions on Nuclear Science 53 ( 6) 3210 -3216

25
2006
X-Ray Irradiation and Bias Effects in Fully-Depleted and Partially-Depleted SiGe HBTs Fabricated on CMOS-Compatible SOI

Marco Bellini , Bongim Jun , Tianbing Chen , John D. Cressler
IEEE Transactions on Nuclear Science 53 ( 6) 3182 -3186

12
2006
An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs

Akil K Sutton , AP Gnana Prakash , Bongim Jun , Enhai Zhao
IEEE Transactions on Nuclear Science 53 ( 6) 3166 -3174

41
2006
Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices

Bongim Jun , Ryan M Diestelhorst , Marco Bellini , Gustavo Espinel
IEEE Transactions on Nuclear Science 53 ( 6) 3203 -3209

31
2006
An Evaluation of Transistor-Layout RHBD Techniques for SEE Mitigation in SiGe HBTs

Akil K. Sutton , Marco Bellini , John D. Cressler , Jonathon A. Pellish
IEEE Transactions on Nuclear Science 54 ( 6) 2044 -2052

42
2007
The Effects of Proton and X-Ray Irradiation on the DC and AC Performance of Complementary (npn + pnp) SiGe HBTs on Thick-Film SOI

Marco Bellini , Bongim Jun , Akil K. Sutton , Aravind C. Appaswamy
IEEE Transactions on Nuclear Science 54 ( 6) 2245 -2250

16
2007
A Comparison of the Effects of X-Ray and Proton Irradiation on the Performance of SiGe Precision Voltage References

Laleh Najafizadeh , Akil K. Sutton , Ryan M. Diestelhorst , Marco Bellini
IEEE Transactions on Nuclear Science 54 ( 6) 2238 -2244

15
2007
Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on >Thin-Film SOI Technology

Marco Bellini , Stanley D. Phillips , Ryan M. Diestelhorst , Peng Cheng
IEEE Transactions on Nuclear Science 55 ( 6) 3197 -3201

9
2008
Performance Evaluation of SiC JBS Diodes Rated for 6.5kV Applications

Andrei Mihaila , Lars Knoll , Lukas Kranz , Enea Bianda
Materials Science Forum 924 597 -600

1
2018
Improved SiO2/ 4H-SiC Interface Defect Density Using Forming Gas Annealing

Stephan Wirths , Giovanni Alfieri , Alyssa Prasmusinto , Andrei Mihaila
Materials Science Forum 963 465 -468

1
2019
Programmable mask design for Phase Controlled Thyristors with automated short positioning

Marco Bellini , Jan Vobecky
conference of the industrial electronics society 000292 -000297

1
2015
Impact of deep trench isolation on advanced SiGe HBT reliability in radiation environments

Stanley D. Phillips , Akil K. Sutton , Aravind Appaswamy , Marco Bellini
international reliability physics symposium 157 -164

15
2009
Advanced TCAD Design Techniques for the Performance Improvement of SiC MOSFETs

Marco Bellini , Lars Knoll
Materials Science Forum 1004 865 -871

2020