Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices
作者： Bongim Jun , Ryan M Diestelhorst , Marco Bellini , Gustavo Espinel , Aravind Appaswamy
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摘要: … off-state drain leakage currents for the selected 130 nm node CMOS devices as a function … and temperature. It is also well-known that cooling CMOS devices to cryogenic temperatures (…
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