作者: Dalin Yao , Mu Gu , Xiaolin Liu , Shiming Huang , Bo Liu
DOI: 10.1016/J.APSUSC.2013.03.170
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摘要: Abstract CsI(Tl) scintillation films are widely used for X-ray imaging because their micro-columnar structure can decrease the lateral spreading of scintillating light. But usually show a disorder near interface substrate and film. In this work, were prepared on substrates covered by special pre-deposited CsI layer. This layer shows morphology isolated islands with uniform distribution which is caused solid-state dewetting. The inter-island distance determined initial film thickness. It found that columns deposited grew from bottom to top without disorder. column diameter distance. XRD patterns only [1 0 0] preferred orientation was same as those layers. performances including light output spatial resolution have been improved when kind