Performance of columnar CsI(Tl) scintillation films prepared on special pre-deposited layers

作者: Dalin Yao , Mu Gu , Xiaolin Liu , Shiming Huang , Bo Liu

DOI: 10.1016/J.APSUSC.2013.03.170

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摘要: Abstract CsI(Tl) scintillation films are widely used for X-ray imaging because their micro-columnar structure can decrease the lateral spreading of scintillating light. But usually show a disorder near interface substrate and film. In this work, were prepared on substrates covered by special pre-deposited CsI layer. This layer shows morphology isolated islands with uniform distribution which is caused solid-state dewetting. The inter-island distance determined initial film thickness. It found that columns deposited grew from bottom to top without disorder. column diameter distance. XRD patterns only [1 0 0] preferred orientation was same as those layers. performances including light output spatial resolution have been improved when kind

参考文章(14)
T. Jing, G. Cho, J. Drewery, I. Fujieda, S.N. Kaplan, A. Mireshghi, V. Perez-Mendez, D. Wildermuth, Enhanced columnar structure in CsI layer by substrate patterning nuclear science symposium and medical imaging conference. ,vol. 39, pp. 1195- 1198 ,(1991) , 10.1109/23.173177
H. Fujita, D.-Y. Tsai, T. Itoh, K. Doi, J. Morishita, K. Ueda, A. Ohtsuka, A simple method for determining the modulation transfer function in digital radiography IEEE Transactions on Medical Imaging. ,vol. 11, pp. 34- 39 ,(1992) , 10.1109/42.126908
V.V. Nagarkar, T.K. Gupta, S.R. Miller, Y. Klugerman, M.R. Squillante, G. Entine, Structured CsI(Tl) scintillators for X-ray imaging applications ieee nuclear science symposium. ,vol. 45, pp. 492- 496 ,(1997) , 10.1109/23.682433
A Ananenko, A Fedorov, A Lebedinsky, P Mateychenko, V Tarasov, Yu Vidaj, None, Structural dependence of CsI(Tl) film scintillation properties Semiconductor Physics, Quantum Electronics and Optoelectronics. ,vol. 7, pp. 297- 300 ,(2004) , 10.15407/SPQEO7.03.297
Bo Kyung Cha, Jun Hyung Bae, Chae-hun Lee, Sungho Chang, Gyuseong Cho, The sensitivity and spatial resolution dependence on the microstructures of CsI:Tl scintillation layer for X-ray imaging detectors Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. ,vol. 633, pp. S297- S299 ,(2011) , 10.1016/J.NIMA.2010.06.194
A Ananenko, A Fedorov, P Mateychenko, V Tarasov, Yu Vidaj, None, Structure and scintillation properties of CsI(Tl) epitaxial layers Applied Surface Science. ,vol. 236, pp. 186- 191 ,(2004) , 10.1016/J.APSUSC.2004.04.015
K. T. Miller, F. F. Lange, D. B. Marshall, The instability of polycrystalline thin films: Experiment and theory Journal of Materials Research. ,vol. 5, pp. 151- 160 ,(1990) , 10.1557/JMR.1990.0151
C V Thompson, Grain Growth in Thin Films Annual Review of Materials Science. ,vol. 20, pp. 245- 268 ,(1990) , 10.1146/ANNUREV.MS.20.080190.001333
T. Jing, C.A. Goodman, J. Drewery, G. Cho, W.S. Hong, H. Lee, S.N. Kaplan, A. Mireshghi, V. Perez-Mendez, D. Wildermuth, Amorphous silicon pixel layers with cesium iodide converters for medical radiography IEEE Transactions on Nuclear Science. ,vol. 41, pp. 903- 909 ,(1994) , 10.1109/23.322829
Jianmin Zhang, Kewei Xu, Effects of grain orientation on abnormal grain growth in bcc-polycrystalline thin films on rigid substrates Journal of Materials Science Letters. ,vol. 18, pp. 939- 941 ,(1999) , 10.1023/A:1006674031785