Deformation of Top‐Down and Bottom‐Up Silver Nanowires

作者: A. M. Leach , M. McDowell , K. Gall

DOI: 10.1002/ADFM.200600735

关键词:

摘要: Atomistic simulations are employed to probe the deformation behavior of experimentally observed top-down and bottom-up face-centered cubic silver nanowires. Stable, oriented nanowires with a rhombic truncated-rhombic cross section considered, representative geometries, as well multiply twinned pentagonal nanowire that is commonly fabricated in approach. The tensile stable, structure simulated failure for each structure. A detailed, mechanistic explanation initial defect nucleation provided nanowire. three geometries shown exhibit different levels strength deform by range mechanisms depending on In particular, be fundamentally different. yield ranging from 1 25 nm diameter reveals addition cross-sectional diameter, strongly tied This study demonstrates size may tailored specific mechanical requirements nanometer-scale devices.

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