Multiple examinations of a sample
作者： Jacobus Hermanus Maria Neijzen , Wendy Uyen Dittmer , Mikhail Mikhaylovich Ovsyanko
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摘要: An apparatus for examination of a sample includes at least one chamber in which the can be provided, where has detection surface; light source emitting first input beam is totally internally reflected surface into output beam, and second partially transmitted through beam. The further detector detecting beams. elongated traversed longitudinal direction by
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