作者: S. Raghavan , P. Rotella , A. Stintz , B. Fuchs , S. Krishna
DOI: 10.1063/1.1498009
关键词:
摘要: Normal incidence InAs/In0.15Ga0.85As dots-in-a-well detectors operating at T=78 K with λp∼7.2 μm and a spectral width (Δλ/λ) of 35% are reported. The peak 7.2 μm is attributed to the bound-to-bound transitions between ground state dot states within InGaAs well. A broad shoulder around 5 μm, which bound-to-continuum transition, also observed. Calibrated blackbody measurements device temperature 78 K yield responsivity 3.58 A/W (Vb=−1 V), detectivity=2.7×109 cm Hz1/2/W (Vb=−0.3 V), conversion efficiency 57% gain ∼25.