Quantitative displacement measurement of a nanotube cantilever with nanometer accuracy using epifluorescence microscopy

摘要: A method to measure the deflection of a nanotube cantilever with nanometer accuracy in an air or liquid environment is presented. We attached fluorescent dyes at end detect its deflection. The was fabricated multiwalled carbon that electrochemically etched tungsten tip, and it imaged epifluorescence microscope system. fluorescence intensity distribution particles approximated Gaussian fitted by least-squares method. Finally, we were able displacement during electrostatic actuation positional few nanometers. This technique can be applied manipulator force transducer on related piconewton forces.