Lin Zhao
机构: Nanyang Technological University Singapore
每年引用次数
引用次数
引用: 117
H-指数: 5
I10-指数 : 2
出版物: 22
Temporal Analysis of the Entire Ethereum Blockchain Network
Arijit Khan , Sourav Sen Gupta , Lin Zhao , Robby Luo
the web conference
21
2021
Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks
Lin Zhao , SH Goh , YH Chan , BL Yeoh
international symposium on the physical and failure analysis of integrated circuits 1 -5
3
2018
Accurate Memory Bitmapping based on Built-in Self-Test: Challenges and Solutions
Lin Zhao , YT Ngow , SH Goh , YH Chan
international symposium on the physical and failure analysis of integrated circuits 1 -8
2019
Localization of Embedded Memories Using EeLADA
M.H. Thor , S.H. Goh , Lin Zhao , B.L. Yeoh
ISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis
4
2018
Characterization of Dynamic Laser Stimulation Approach to Locate Memory Fails Using EeLADA
S.H. Goh , B.L. Yeoh , Y.T. Ngow , Hu Hao
ISTFA 2017: Conference Proceedings from the 43rd International Symposium for Testing and Failure Analysis
2017
Optimization of EeLADA for Circuit Logic Defect Localization Using Defect Simulation
M. Lee , B.L. Yeoh , S.H. Goh , G.F. You
ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis
1
2016
Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success
Lin Zhao , S.H. Goh , Y.H. Chan , B.L. Yeoh
Microelectronics Reliability 92 ( 92) 136 -142
3
2019
Graph Mining and Machine Learning for Shader Codes Analysis to Accelerate GPU Tuning
Lin Zhao , Arijit Khan , Robby Luo , Chai Kiat Yeo
International Conference on Complex Networks and their Applications
2022
ShaderNet: graph-based shader code analysis to accelerate GPU's performance improvement
Lin Zhao , Arijit Khan , Robby Luo
GRADES-NDA@SIGMOD
2022
Defect isolation methods and systems
Szu Huat Goh , Yin Hong Chan , Boon Lian Yeoh , Jeffrey Chor Keung Lam
5
2018
Anomalous Wafer Map Detection and Localization using Unsupervised Learning
Lin Zhao , Chai Kiat Yeo
The 20th International Conference on IC Design and Technology
2023
Defect localization in embedded memory
Szu Huat Wu Shifa GOH , Yin Hong Chan , Boon Lian Yeoh , Lin Zhao
2021
Fault isolation of digital scan logic without ‘scan diagnosis’
B. L. Yeoh , S. H. Goh , G. F. You , Hu Hao
international symposium on the physical and failure analysis of integrated circuits 1 -5
2017
A detailed analysis scheme to interpret multiple photon emissions micrograph for improved diagnostic resolution on open defects
S. H. Goh , Edmund C Manlangit , Edy Susanto , B. L. Yeoh
international symposium on the physical and failure analysis of integrated circuits 1 -6
2
2017
Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA
S.H. Goh , Tay Chee Chun , Y.T. Ngow , B.L. Yeoh
international symposium on the physical and failure analysis of integrated circuits 1 -5
2018
A Demonstration on the Effectiveness of Wafer-level Thermal Microscopy as A Complementary Tool to Photon Emission Microscopy Using MBIST Failure Debug
BL Yeoh , SH Goh , MH Thor , Hu Hao
international symposium on the physical and failure analysis of integrated circuits
2018
Fault Localization Using Dynamic Optical-beam Induced Current Variation Mapping
MH Thor , SH Goh , BL Yeoh , Hu Hao
international symposium on the physical and failure analysis of integrated circuits 1 -8
1
2019
Experimental Demonstration of the Effects of Laser Pulse Duration on SEU and LADA in CMOS Devices
S.H. Goh , B.L. Yeoh , Hu Hao , Y.H. Chan
ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis
2016
Dynamic optical beam induced current variation mapping: A fault isolation technique
M.H. Thor , S.H. Goh , B.L. Yeoh , Hu Hao
Microelectronics Reliability 107 113603
1
2020
Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction
S.H. Goh , Y.H. Chan , Zhao Lin , Jeffrey Lam
Integration 59 198 -205
2017