作者: S. Kontermann , A. Grohe , R. Preu
DOI: 10.1109/PVSC.2008.4922788
关键词: Thermal 、 Passivation 、 Nanotechnology 、 Crystallite 、 Scanning electron microscope 、 Contact resistance 、 Optoelectronics 、 Annealing (metallurgy) 、 Silicon 、 Materials science 、 Temperature measurement
摘要: … For cutting costs, thick film metallization is used for the front side. In this paper annealing … to standard industrial silicon solar cells to probe the sensitivity for such a front side metallization …