En-face scanning optical coherence tomography with ultra-high resolution for material investigation

作者: Karin Wiesauer , Michael Pircher , Erich Götzinger , Siegfried Bauer , Rainer Engelke

DOI: 10.1364/OPEX.13.001015

关键词: Optical coherence tomographyLaserResolution (electron density)SignalMaterials scienceNondestructive testingHeterodyneBroadbandOpticsOptoelectronicsSensitivity (electronics)

摘要: Optical coherence tomography (OCT) is an emerging technique for cross-sectional imaging, originally developed biological structures. When OCT employed material investigation, high-resolution and short measurement times are required, many applications, only transversal (en-face) scans yield substantial information which cannot be obtained from images oriented perpendicularly to the sample surface alone. In this work, we combine with ultra-high resolution OCT: a broadband femto-second laser used as light source in combination acousto-optic modulators heterodyne signal generation detection. With our setup able scan areas large 3 x mm2 sensitivity of 100 dB, representing larger compared other en-face systems (full field). We demonstrate benefits scanning different applications materials investigation.

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