Space-invariant multiple-beam achromatic EUV interference lithography

作者: Harun H. Solak

DOI: 10.1016/J.MEE.2005.01.012

关键词: OpticsResistDiffraction gratingExtreme ultraviolet lithographyOptical filterPhotolithographyUndulatorExtreme ultravioletInterference lithographyChemistry

摘要: We report the production of two-dimensional periodic patterns with defined cell shapes, such as arrays circular rings, multiple-beam extreme ultraviolet (EUV) interference lithography. The method combines coherent and incoherent addition fields in a single exposure step to produce high-resolution, space-invariant intensity patterns. use wideband light, instead highly monochromatic sources like lasers, eliminates variation pattern multiple beams interfere. technique is especially useful EUV region undulator that wavelength range provide radiation relatively wide bandwidth. In demonstration experiments nanometer scale rings dots PMMA resist were obtained. has potential for applications where periodically repeated structures are needed display units, optical filters, electronic memory logic circuits magnetic storage devices.

参考文章(9)
H. H. Solak, C. David, J. Gobrecht, L. Wang, F. Cerrina, Multiple-beam interference lithography with electron beam written gratings Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 20, pp. 2844- 2848 ,(2002) , 10.1116/1.1518015
Y. Liu, J. Barhen, Y. Braiman, J. X. Zhong, Interference pattern formation from an array of coherent laser beams Journal of Vacuum Science & Technology B. ,vol. 20, pp. 2602- 2605 ,(2002) , 10.1116/1.1523396
C. A. Ross, Henry I. Smith, T. Savas, M. Schattenburg, M. Farhoud, M. Hwang, M. Walsh, M. C. Abraham, R. J. Ram, Fabrication of patterned media for high density magnetic storage Journal of Vacuum Science & Technology B. ,vol. 17, pp. 3168- 3176 ,(1999) , 10.1116/1.590974
L. J. Heyderman, C. David, M. Kläui, C. A. F. Vaz, J. A. C. Bland, Nanoscale ferromagnetic rings fabricated by electron-beam lithography Journal of Applied Physics. ,vol. 93, pp. 10011- 10013 ,(2003) , 10.1063/1.1577224
Xiaolan Chen, Saleem H Zaidi, SRJ Brueck, Daniel J Devine, Interferometric lithography of sub‐micrometer sparse hole arrays for field‐emission display applications Journal of Vacuum Science & Technology B. ,vol. 14, pp. 3339- 3349 ,(1996) , 10.1116/1.588533
H. H. Solak, D. He, W. Li, S. Singh-Gasson, F. Cerrina, B. H. Sohn, X. M. Yang, P. Nealey, Exposure of 38 nm period grating patterns with extreme ultraviolet interferometric lithography Applied Physics Letters. ,vol. 75, pp. 2328- 2330 ,(1999) , 10.1063/1.125005
H.H. Solak, C. David, J. Gobrecht, V. Golovkina, F. Cerrina, S.O. Kim, P.F. Nealey, Sub-50 nm period patterns with EUV interference lithography Microelectronic Engineering. ,vol. 67, pp. 56- 62 ,(2003) , 10.1016/S0167-9317(03)00059-5
Andres Fernandez, Don W. Phillion, Effects of phase shifts on four-beam interference patterns. Applied Optics. ,vol. 37, pp. 473- 478 ,(1998) , 10.1364/AO.37.000473
TA Savas, ML Schattenburg, JM Carter, Henry I Smith, Large‐area achromatic interferometric lithography for 100 nm period gratings and grids Journal of Vacuum Science & Technology B. ,vol. 14, pp. 4167- 4170 ,(1996) , 10.1116/1.588613