作者: Carole A. Machida , Z.A. Munir
DOI: 10.1016/0022-0248(84)90104-0
关键词: Dislocation 、 Nucleation 、 Isothermal process 、 Etch pit density 、 Analytical chemistry 、 Field (physics) 、 Electric field 、 Chemistry 、 Crystallography 、 Evaporation 、 Field strength
摘要: The development of thermal etch pits on cleaved (100) surfaces sodium chloride crystals was investigated in relation to an external DC electric field applied along the [100] direction. Measurements pit size and density were made after isothermal isochronic evaporation fields with gradients ranging up 130 kV m-1. Below a minimum (threshold) value gradient, unaffected by presence field. In threshold resulted enhancement nucleation as judged marked increase their no change size. At higher fields, enhanced growth are evident. gradient observed corresponded previously reported phenomena for from NaCl. dislocation densities regions below evaporated surface showed decrease increasing strength beyond value. These results interpreted suggesting migration charged dislocations