作者: Abdul Rafay Khatri , Ali Hayek , Josef Borcsok
DOI: 10.1109/INTELLECT.2017.8277633
关键词: Test vector 、 Fault tolerance 、 Fault model 、 Field-programmable gate array 、 Reliability engineering 、 Test method 、 Fault (power engineering) 、 Automatic test equipment 、 Fault injection 、 Computer science
摘要: SRAM-based FPGA covers nearly 60% of the applications, also susceptible to Single Event Upsets (SEUs) due radiation. Therefore, FPGA-based systems need be tested and verified. The testing dependability analysis techniques are most widely used, with fault injection techniques. These approaches developed in RASP-Fault Injection Tool. require deliberate introduction faults target system. In test approach, it is mandatory obtain minimum vectors which detect maximum faults. There many models used for that purpose, e.g. bit-flip, stuck-at (1 & 0). proposed condition set point value (SP-value) defined each model. only patterns can more than SP-value collected called them qualified vectors. Furthermore, these compact Automatic Test Equipment (ATE). our previously method, we have concept method vector designs. We chosen SP-values range 20% 50% total injected design. However, this paper, validation selection criterion presented.