Validation of selecting SP-values for fault models under proposed RASP-FIT tool

作者: Abdul Rafay Khatri , Ali Hayek , Josef Borcsok

DOI: 10.1109/INTELLECT.2017.8277633

关键词: Test vectorFault toleranceFault modelField-programmable gate arrayReliability engineeringTest methodFault (power engineering)Automatic test equipmentFault injectionComputer science

摘要: SRAM-based FPGA covers nearly 60% of the applications, also susceptible to Single Event Upsets (SEUs) due radiation. Therefore, FPGA-based systems need be tested and verified. The testing dependability analysis techniques are most widely used, with fault injection techniques. These approaches developed in RASP-Fault Injection Tool. require deliberate introduction faults target system. In test approach, it is mandatory obtain minimum vectors which detect maximum faults. There many models used for that purpose, e.g. bit-flip, stuck-at (1 & 0). proposed condition set point value (SP-value) defined each model. only patterns can more than SP-value collected called them qualified vectors. Furthermore, these compact Automatic Test Equipment (ATE). our previously method, we have concept method vector designs. We chosen SP-values range 20% 50% total injected design. However, this paper, validation selection criterion presented.

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