作者: Seong-Je Park , Soon-Won Lee , Ki-Joong Lee , Ji-Hye Lee , Ki-Don Kim
DOI: 10.1007/S11671-010-9678-Y
关键词: Spin coating 、 Wafer 、 Anti-reflective coating 、 Dewetting 、 Silver nanoparticle 、 Silicon 、 Materials science 、 Nanotechnology 、 Etching (microfabrication) 、 Nanostructure
摘要: An alternative method is presented for fabricating an antireflective nanostructure array using nanosilver colloidal lithography. Spin coating was used to produce the multilayered silver nanoparticles, which grew by self-assembly and were transformed into randomly distributed islands through thermodynamic action of dewetting Oswald ripening. The average size coverage rate increased with concentration in range 50–90 nm 40–65%, respectively. critically affected spin speed. effects these two parameters investigated, after etching wet removal residues. reflection nearly disappeared ultraviolet wavelength 17% a bare silicon wafer visible range.