作者: A Ulčinas , Š Vaitekonis
关键词: Atomic force microscopy 、 Optics 、 Rotation around a fixed axis 、 Materials science 、 Translational motion 、 Conductive atomic force microscopy 、 Fast scanning 、 Resolution (electron density) 、 Image reconstruction algorithm 、 Nanotechnology
摘要: … A non-raster scanning technique for atomic force microscopy (AFM) imaging which combines rotational and translational motion is presented. The use of rotational motion for the fast …