Rotational scanning atomic force microscopy

作者: A Ulčinas , Š Vaitekonis

DOI: 10.1088/1361-6528/AA5AF7

关键词: Atomic force microscopyOpticsRotation around a fixed axisMaterials scienceTranslational motionConductive atomic force microscopyFast scanningResolution (electron density)Image reconstruction algorithmNanotechnology

摘要: … A non-raster scanning technique for atomic force microscopy (AFM) imaging which combines rotational and translational motion is presented. The use of rotational motion for the fast …

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