High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers.
作者： Jonathan D. Adams , Adrian Nievergelt , Blake W. Erickson , Chen Yang , Maja Dukic
DOI: 10.1063/1.4895460
关键词: Standard sample 、 Controller (computing) 、 Resonance 、 Scanner 、 Atomic force microscopy 、 Cantilever 、 Head (vessel) 、 Upgrade 、 Nanotechnology 、 Materials science 、 Optoelectronics
摘要: We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM is designed to be in size, easily integrated into a commercial system, and has modular architecture facilitating exchange of the electronic assemblies. two different designs both readout systems, evaluate their performance. Using cantilevers with our otherwise unmodified we are able take tapping mode images approximately 5–10 times faster compared same system using large By additional scanner turnaround resonance compensation controller high-speed imaging, show imaging lipid bilayers at line scan rates 100–500 Hz areas several micrometers size.
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