Structural phase transitions of BaNbxTi1−xO3(0.0⩽x⩽0.5) thin films
作者： Haizhong Guo , Lifeng Liu , Shuo Ding , Huibin Lu , Yueliang Zhou
DOI: 10.1063/1.1782271
关键词: Molecular beam epitaxy 、 Raman spectroscopy 、 Crystallography 、 X-ray crystallography 、 Lattice constant 、 Thin film 、 Spectroscopy 、 Tetragonal crystal system 、 Materials science 、 Ferroelectricity
摘要: The phase transition behavior of BaNbxTi1−xO3 (BNTO) (0.0⩽x⩽0.50) thin films grown on MgO substrates by laser molecular beam epitaxy was systematically investigated using x-ray diffraction (XRD) and micro-Raman spectroscopy. asymmetric rocking XRD scan measurements show that with an increase Nb-doped content, the lattice parameters c a while c∕a ratio decreases, indicating decrease tetragonality BNTO films. intensity Raman signal decreases width bands broaden content. results spectra indicate at room temperature Nb⩽10 at. % have tetragonal structure, however, for Nb⩾20 at. %, exhibit typical disordering cubic structure.
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