Refractive Index Dispersion and Analysis of the Optical Parameters of (PMMA/PVA) Thin Film
作者： Tagreed K. Hamad ,
关键词: Refractive index dispersion 、 Effective mass (solid-state physics) 、 Single oscillator 、 Oscillator strength 、 Refractive index 、 Analytical chemistry 、 Thin film 、 Dielectric 、 Wavelength 、 Materials science
摘要: The optical characteristics of (PMMA/PVA) thin films are investigated by spectrometric measurements. Sample with different percentage prepared constant thickness (110 m) using casting technique. real (n) and imaginary (k) parts refractive index dielectric the determined. Some important parameters absorption, such as oscillator energy (E0), dispersion (Ed), average value strength (S0), wavelength (0) single ratio carrier concentration to effective mass (N/m*) have been evaluated. values obtained for high frequency through two procedures in range (6.31-7.35) all ranges concentrations.
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