Punchthrough type GTO with buffer layer and homogeneous low efficiency anode structure

作者: S. Eicher , F. Bauer , A. Weber , H.R. Zeller , W. Fichtner

DOI: 10.1109/ISPSD.1996.509495

关键词: WaferAnodeNew deviceThyristorElectrical engineeringOptoelectronicsBuffer (optical fiber)HomogeneousLayer (electronics)Materials science

摘要: A new type of full scale 4.5 kV/3 kA GTO has been developed, fabricated, and electrically characterized. The device utilizes a punchthrough concept with buffer layer. To avoid the requirement excessive gate currents for turn-on, homogeneous anode layer without shorts. very low efficiency, which allows efficient extraction charge during turn-off. With layer, significantly reduced wafer thickness as compared to conventional devices buffer. This reduces switching well on-state losses. turn-off losses best were one third those GTOs and, at same time, decreased by more than third.

参考文章(7)
H. Dettmer, W. Fichtner, F. Bauer, T. Stockmeier, Punch-through IGBTs with homogeneous n-base operating at 4 kV line voltage international symposium on power semiconductor devices and ic's. pp. 492- 496 ,(1995) , 10.1109/ISPSD.1995.515087
H.R. Zeller, Cosmic ray induced breakdown in high voltage semiconductor devices, microscopic model and phenomenological lifetime prediction international symposium on power semiconductor devices and ic's. pp. 339- 340 ,(1994) , 10.1109/ISPSD.1994.583762
H. Dettmer, W. Fichtner, F. Bauer, 4.5 kV MCT with buffer layer and anode short structure international symposium on power semiconductor devices and ic's. pp. 13- 17 ,(1994) , 10.1109/ISPSD.1994.583627
H. Kabza, H.-J. Schulze, Y. Gerstenmaier, P. Voss, J.W.W. Schmid, F. Pfirsch, K. Platzoder, Cosmic radiation as a cause for power device failure and possible countermeasures international symposium on power semiconductor devices and ic's. pp. 9- 12 ,(1994) , 10.1109/ISPSD.1994.583620
H.R. Zeller, Cosmic ray induced failures in high power semiconductor devices Solid-state Electronics. ,vol. 38, pp. 2041- 2046 ,(1995) , 10.1016/0038-1101(95)00082-5
B.J. Baliga, The MOS-gated emitter switched thyristor IEEE Electron Device Letters. ,vol. 11, pp. 75- 77 ,(1990) , 10.1109/55.46933
T. Nakagawa, F. Tokunoh, M. Yamamoto, S. Koga, A new high power low loss GTO international symposium on power semiconductor devices and ic's. pp. 84- 88 ,(1995) , 10.1109/ISPSD.1995.515014