Pseudorandom Functional BIST for Linear and Nonlinear MEMS
作者： A. Dhayni , S. Mir , L. Rufer , A. Bounceur
关键词: Linear system 、 Pseudorandom number generator 、 Nonlinear system 、 Computer science 、 Signal processing 、 Device under test 、 LTI system theory 、 Pseudorandom generator theorem 、 Electronic engineering 、 Pseudorandom binary sequence
摘要: Pseudorandom test techniques are widely used for measuring the impulse response (IR) linear devices and Volterra kernels nonlinear devices, especially in acoustics domain. This paper studies application of pseudorandom functional to MEMS Built-In-Self-Test (BIST). We will first present classical BIST technique Linear Time Invariant (LTI) systems which is based on evaluation IR Device Under Test (DUT) stimulated by a Maximal Length Sequence (MLS). Then we introduce new type stimuli called Inverse-Repeat (IRS) that proves better immunity noise distortion than MLS. Next, illustrate these weakly nonlinear, purely strongly devices.
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